Optoelectronic Oscillators

Patrice Salzenstein (2011). Optoelectronic Oscillators, Optoelectronic Devices and Properties, Oleg Sergiyenko (Ed.), ISBN: 978-953-307-204-3, InTech, Available from: http://www.intechopen.com/articles/show/title/optoelectronic-oscillatorsOptoelectronic devices impact many areas of society, from simple household appliances and multimedia systems to communications, computing, spatial scanning, optical monitoring, 3D measurements and medical instruments. This is the most complete book about optoelectromechanic systems and semiconductor optoelectronic devices; it provides an accessible, well-organized overview of optoelectronic devices and properties that emphasizes basic principles

Optoelectronic Oscillators Phase Noise and Stability Measurements

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Low uncertainty determined by modern approach for high precision optoelectronic phase noise measurements

International audienceUncertainty on phase noise is calculated by modern approach for an optoelectronic measurement system. The final global uncertainty on the spectral density of phase noise determined by this method is lower than 2 dB

Realization of a 5 and 10 MHz High Performance Isolation Distribution Amplifier for short term frequency stability measurements of frequency sources

International audienceOur Laboratoire National d'Essai (LNE) associate laboratory is accredited to deliver calibration certificates in the short term domain. For spectral density of phase noise and short term frequency stability measurements, it is necessary to have the best reference source signals. However, the noise of the distribution amplifier has to be the weakest possible in order to keep the lowest noise floor. In order to deliver references signals, we achieve a high performances distribution amplifier. In terms of Allan variance, performance of the realized four channels distribution amplifier is respectively better than sigmay(to=1s) = 1,4.10-14 and 7,3.10-15 at 5 and 10 MHz. The intrinsic spectral density of phase noise is then better than Sphi(1Hz) = –141,4 dB.rad²/Hz at 5 MHz and –141 dB.rad²/Hz at 10 MHz with a 1/f slope

An example of design, optimization, stabilization and noise performances of resonator-based optoelectronic oscillators

In this paper we talk about oscillators of optoelectronic type with intensity modulators and high-quality optical resonators technology. This subject is illustrated by an example of realization from the material to the characterization of the realized oscillator. It is explained how such an oscillator is designed and how it can be optimized

Short-Term Frequency Stability Measurement of BVA Oscillators

This paper discusses the time-domain measurement of short-term frequency stability of ultra-stable BVA oscillators with flicker frequency modulation noise on the order of 10‑14 at averaging intervals from hundreds of milliseconds to tens of seconds. The stability has been measured with a highly sensitive phase-time comparator based on the dual-mixer time-difference multiplication with a background instability of ≈7x10-15/τ in terms of Allan deviation. A discrepancy has been observed in the comparator background noise found with two signals from a single oscillator (comparator test) and with two signals from two oscillators (stability measurements)

Investigation in acousto-optic laser stabilization for crystal resonator-based optoelectronic oscillators

International audiencePotentialities are investigated for using acousto-optic cells based on a TeO2 crystal to stabilize a microwave signal generated by an optoelectronic oscillator. Bulk acoustic waves at two radio frequencies (RF) near 60 MHz are launched in the two identical cells providing a required locking on of a microwave signal. Differences between RF signals are up to 400 kHz to follow quality factor of the optic resonator typically in the range of 5×108. Critical alignment of the two cells is performed thanks to an extraordinary polarized laser beam launched at a very low Bragg angle of light incidence. Moreover, the system is operating for any resonator to be inserted into the optoelectronic oscillator with a Q factor in the range of 2×107−1011

Ultra high quality factor optoelectronic oscillator stabilized with acousto optic cells

International audienceTeO2–crystal–based acousto-optic cells allows the stabilization of an optoelectronic oscillator (OEO). The system is operating for any resonator to be inserted into the OEO with a Q-factor from 2x10^7 to 10^11

Démarche qualité au sein d'un laboratoire de recherche du CNRS: FEMTO-ST

National audienceDans ce papier est présenté la démarche qualité menée par le CNRS et l'Université de Franche Comté au sein de l'institut FEMTO-ST, avec la mise en oeuvre du label Carnot, et les activités d'étalonnages du LNE-LTFB, laboratoire commun avec l'Observatoire de Besançon et associé au LNE

Investigation in Low Drive Level Sensitivity of Quartz Resonator Affecting its Motional Parameters

Usually, starting of oscillation in a quartz crystal oscillator requires a resonator's input power in the range of – 20 dBm, but under storage a phenomenon known as Drive Level Dependency (DLD) or Drive Level Sensitivity (DLS) may appear that prevents the starting of oscillation. Several studies performed in the past have shown that at low drive level some quartz resonators may exhibit a large increase of their series resistance preventing the starting of oscillation. This work reviews the studies and results obtained for nearly fifty years on very low drive level sensitivity of quartz. The various mechanisms and models based on the hypothesis of moving particles and surface defects in the resonator inducing resistance increase and its relation with noise mechanism are reviewed as well. Also, the paper describes several experimental set-ups, and measurement procedures used to obtain very low drive level motional parameters. This work is a contribution to understand the problem of starting quartz after a long storage period. Some preliminary results of the series resistance measured at very low drive level are also presented